 |
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
| Datasheet File OCR Text: |
| 28F010 1024K (128K x 8) CMOS FLASH MEMORY Y Flash Electrical Chip-Erase 1 Second Typical Chip-Erase Quick Pulse Programming Algorithm 10 ms Typical Byte-Program 2 Second Chip-Program 100 000 Erase Program Cycles 12 0V g5% VPP High-Performance Read 65 ns Maximum Access Time CMOS Low Power Consumption 10 mA Typical Active Current 50 mA Typical Standby Current 0 Watts Data Retention Power Integrated Program Erase Stop Timer Y Y Command Register Architecture for Microprocessor Microcontroller Compatible Write Interface Noise Immunity Features g10% VCC Tolerance Maximum Latch-Up Immunity through EPI Processing ETOX TM Nonvolatile Flash Technology EPROM-Compatible Process Base High-Volume Manufacturing Experience JEDEC-Standard Pinouts 32-Pin Plastic Dip 32-Lead PLCC 32-Lead TSOP (See Packaging Spec Order 231369) Y Y Y Y Y Y Y Y Y Extended Temperature Options Intel's 28F010 CMOS flash memory offers the most cost-effective and reliable alternative for read write random access nonvolatile memory The 28F010 adds electrical chip-erasure and reprogramming to familiar EPROM technology Memory contents can be rewritten in a test socket in a PROM-programmer socket onboard during subassembly test in-system during final test and in-system after-sale The 28F010 increases memory flexibility while contributing to time and cost savings The 28F010 is a 1024 kilobit nonvolatile memory organized as 131 072 bytes of 8 bits Intel's 28F010 is offered in 32-pin plastic dip or 32-lead PLCC and TSOP packages Pin assignments conform to JEDEC standards for byte-wide EPROMs Extended erase and program cycling capability is designed into Intel's ETOX (EPROM Tunnel Oxide) process technology Advanced oxide processing an optimized tunneling structure and lower electric field combine to extend reliable cycling beyond that of traditional EEPROMs With the 12 0V VPP supply the 28F010 performs 100 000 erase and program cycles well within the time limits of the Quick Pulse Programming and Quick Erase algorithms Intel's 28F010 employs advanced CMOS circuitry for systems requiring high-performance access speeds low power consumption and immunity to noise Its 65 nanosecond access time provides no-WAIT-state performance for a wide range of microprocessors and microcontrollers Maximum standby current of 100 mA translates into power savings when the device is deselected Finally the highest degree of latch-up protection is achieved through Intel's unique EPI processing Prevention of latch-up is provided for stresses up to 100 mA on address and data pins from b 1V to VCC a 1V With Intel's ETOX process base the 28F010 builds on years of EPROM experience to yield the highest levels of quality reliability and cost-effectiveness Other brands and names are the property of their respective owners Information in this document is provided in connection with Intel products Intel assumes no liability whatsoever including infringement of any patent or copyright for sale and use of Intel products except as provided in Intel's Terms and Conditions of Sale for such products Intel retains the right to make changes to these specifications at any time without notice Microcomputer Products may have minor variations to this specification known as errata COPYRIGHT INTEL CORPORATION 1995 November 1995 Order Number 290207-010 28F010 290207 - 1 Figure 1 28F010 Block Diagram Table 1 Pin Description Symbol A0 -A16 DQ0 -DQ7 Type INPUT INPUT OUTPUT Name and Function ADDRESS INPUTS for memory addresses Addresses are internally latched during a write cycle DATA INPUT OUTPUT Inputs data during memory write cycles outputs data during memory read cycles The data pins are active high and float to tri-state OFF when the chip is deselected or the outputs are disabled Data is internally latched during a write cycle CHIP ENABLE Activates the device's control logic input buffers decoders and sense amplifiers CE is active low CE high deselects the memory device and reduces power consumption to standby levels OUTPUT ENABLE Gates the devices output through the data buffers during a read cycle OE is active low WRITE ENABLE Controls writes to the control register and the array Write enable is active low Addresses are latched on the falling edge and data is latched on the rising edge of the WE pulse Note With VPP s 6 5V memory contents cannot be altered ERASE PROGRAM POWER SUPPLY for writing the command register erasing the entire array or programming bytes in the array DEVICE POWER SUPPLY (5V g10%) GROUND NO INTERNAL CONNECTION to device Pin may be driven or left floating CE INPUT OE WE INPUT INPUT VPP VCC VSS NC 2 28F010 28F010 290207 - 3 290207 - 2 290207 - 17 290207 - 18 Figure 2 28F010 Pin Configurations 3 28F010 Material and labor costs associated with code changes increases at higher levels of system integration the most costly being code updates after sale Code ``bugs'' or the desire to augment system functionality prompt after-sale code updates Field revisions to EPROM-based code requires the removal of EPROM components or entire boards With the 28F010 code updates are implemented locally via an edge-connector or remotely over a communcation link For systems currently using a high-density static RAM battery configuration for data accumulation flash memory's inherent nonvolatility eliminates the need for battery backup The concern for battery failure no longer exists an important consideration for portable equipment and medical instruments both requiring continuous performance In addition flash memory offers a considerable cost advantage over static RAM Flash memory's electrical chip erasure byte programmability and complete nonvolatility fit well with data accumulation and recording needs Electrical chip-erasure gives the designer a ``blank slate'' in which to log or record data Data can be periodically off-loaded for analysis and the flash memory erased producing a new ``blank slate'' A high degree of on-chip feature integration simplifies memory-to-processor interfacing Figure 4 depicts two 28F010s tied to the 80C186 system bus The 28F010's architecture minimizes interface circuitry needed for complete in-circuit updates of memory contents The outstanding feature of the TSOP (Thin Small Outline Package) is the 1 2 mm thickness With standard and reverse pin configurations TSOP reduces the number of board layers and overall volume necessary to layout multiple 28F010s TSOP is particularly suited for portable equipment and applications requiring large amounts of flash memory Figure 3 illustrates the TSOP Serpentine layout With cost-effective in-system reprogramming extended cycling capability and true nonvolatility the 28F010 offers advantages to the alternatives EPROMs EEPROMs battery backed static RAM or disk EPROM-compatible read specifications straight-forward interfacing and in-circuit alterability offers designers unlimited flexibility to meet the high standards of today's designs APPLICATIONS The 28F010 flash memory provides nonvolatility along with the capability to perform over 100 000 electrical chip-erasure reprogram cycles These features make the 28F010 an innovative alternative to disk EEPROM and battery-backed static RAM Where periodic updates of code and data-tables are required the 28F010's reprogrammability and nonvolatility make it the obvious and ideal replacement for EPROM Primary applications and operating systems stored in flash eliminate the slow disk-to-DRAM download process This results in dramatic enhancement of performance and substantial reduction of power consumption a consideration particularly important in portable equipment Flash memory increases flexibility with electrical chip erasure and in-system update capability of operating systems and application code With updatable code system manufacturers can easily accommodate last-minute changes as revisions are made In diskless workstations and terminals network traffic reduces to a minimum and systems are instanton Reliability exceeds that of electromechanical media Often in these environments power interruptions force extended re-boot periods for all networked terminals This mishap is no longer an issue if boot code operating systems communication protocols and primary applications are flash-resident in each terminal For embedded systems that rely on dynamic RAM disk for main system memory or nonvolatile backup storage the 28F010 flash memory offers a solid state alternative in a minimal form factor The 28F010 provides higher performance lower power consumption instant-on capability and allows an ``execute in place'' memory hierarchy for code and data table reading Additionally the flash memory is more rugged and reliable in harsh environments where extreme temperatures and shock can cause disk-based systems to fail The need for code updates pervades all phases of a system's life from prototyping to system manufacture to after-sale service The electrical chip-erasure and reprogramming ability of the 28F010 allows incircuit alterability this eliminates unnecessary handling and less-reliable socketed connections while adding greater test manufacture and update flexibility 4 28F010 Figure 3 TSOP Serpentine Layout 5 290207- 21 28F010 290207 - 4 Figure 4 28F010 in a 80C186 System PRINCIPLES OF OPERATION Flash-memory augments EPROM functionality with in-circuit electrical erasure and reprogramming The 28F010 introduces a command register to manage this new functionality The command register allows for 100% TTL-level control inputs fixed power supplies during erasure and programming and maximum EPROM compatibility In the absence of high voltage on the VPP pin the 28F010 is a read-only memory Manipulation of the external memory-control pins yields the standard EPROM read standby output disable and Intelligent Identifier operations The same EPROM read standby and output disable operations are available when high voltage is applied to the VPP pin In addition high voltage on VPP enables erasure and programming of the device All functions associated with altering memory contents Intelligent Identifier erase erase verify program and program verify are accessed via the command register Commands are written to the register using standard microprocessor write timings Register contents serve as input to an internal state-machine which controls the erase and programming circuitry Write cycles also internally latch addresses and data needed for programming or erase operations With the appropriate command written to the register standard microprocessor read timings output array data access the Intelligent Identifier codes or output data for erase and program verification Integrated Stop Timer Successive command write cycles define the durations of program and erase operations specifically the program or erase time durations are normally terminated by associated program or erase verify commands An integrated stop timer provides simplified timing control over these operations thus eliminating the need for maximum program erase timing specifications Programming and erase pulse durations are minimums only When the stop timer terminates a program or erase operation the device enters an inactive state and remains inactive until receiving the appropriate verify or reset command Write Protection The command register is only active when VPP is at high voltage Depending upon the application the system designer may choose to make the VPP power supply switchable available only when memory updates are desired When VPP e VPPL the con- 6 28F010 Table 2 28F010 Bus Operations Mode Read Output Disable READ-ONLY Standby Intelligent Identifier (Mfr)(2) Intelligent Identifier (Device)(2) Read READ WRITE Output Disable Standby(5) Write VPP(1) VPPL VPPL VPPL VPPL VPPL VPPH VPPH VPPH VPPH A0 A0 X X VIL VIH A0 X X A0 A9 A9 X X VID(3) VID(3) A9 X X A9 CE VIL VIL VIH VIL VIL VIL VIL VIH VIL OE VIL VIH X VIL VIL VIL VIH X VIH WE VIH VIH X VIH VIH VIH VIH X VIL DQ0 -DQ7 Data Out Tri-State Tri-State Data e 89H Data e B4H Data Out(4) Tri-State Tri-State Data In(6) NOTES 1 Refer to DC Characteristics When VPP e VPPL memory contents can be read but not written or erased 2 Manufacturer and device codes may also be accessed via a command register write sequence Refer to Table 3 All other addresses low 3 VID is the Intelligent Identifier high voltage Refer to DC Characteristics 4 Read operations with VPP e VPPH may access array data or the Intelligent Identifier codes 5 With VPP at high voltage the standby current equals ICC a IPP (standby) 6 Refer to Table 3 for valid Data-In during a write operation 7 X can be VIL or VIH tents of the register default to the read command making the 28F010 a read-only memory In this mode the memory contents cannot be altered Or the system designer may choose to ``hardwire'' VPP making the high voltage supply constantly available In this case all Command Register functions are inhibited whenever VCC is below the write lockout voltage VLKO (See Power Up Down Protection) The 28F010 is designed to accommodate either design practice and to encourage optimization of the processor-memory interface The two-step program erase write sequence to the Command Register provides additional software write protections BUS OPERATIONS Read The 28F010 has two control functions both of which must be logically active to obtain data at the outputs Chip-Enable (CE ) is the power control and should be used for device selection Output-Enable (OE ) is the output control and should be used to gate data from the output pins independent of device selection Refer to AC read timing waveforms When VPP is high (VPPH) the read operation can be used to access array data to output the Intelligent Identifier codes and to access data for program erase verification When VPP is low (VPPL) the read operation can only access the array data Output Disable With OE at a logic-high level (VIH) output from the device is disabled Output pins are placed in a highimpedance state Standby With CE at a logic-high level the standby operation disables most of the 28F010's circuitry and substantially reduces device power consumption The outputs are placed in a high-impedance state independent of the OE signal If the 28F010 is deselected during erasure programming or program erase verification the device draws active current until the operation is terminated Intelligent Identifier Operation The Intelligent Identifier operation outputs the manufacturer code (89H) and device code (B4H) Programming equipment automatically matches the device with its proper erase and programming algorithms 7 28F010 With CE and OE at a logic low level raising A9 to high voltage VID (see DC Characteristics) activates the operation Data read from locations 0000H and 0001H represent the manufacturer's code and the device code respectively The manufacturer- and device-codes can also be read via the command register for instances where the 28F010 is erased and reprogrammed in the target system Following a write of 90H to the command register a read from address location 0000H outputs the manufacturer code (89H) A read from address 0001H outputs the device code (B4H) Write Device erasure and programming are accomplished via the command register when high voltage is applied to the VPP pin The contents of the register serve as input to the internal state-machine The state-machine outputs dictate the function of the device The command register itself does not occupy an addressable memory location The register is a latch used to store the command along with address and data information needed to execute the command The command register is written by bringing WE to a logic-low level (VIL) while CE is low Addresses are latched on the falling edge of WE while data is latched on the rising edge of the WE pulse Standard microprocessor write timings are used Refer to AC Write Characteristics and the Erase Programming Waveforms for specific timing parameters COMMAND DEFINITIONS When low voltage is applied to the VPP pin the contents of the command register default to 00H enabling read-only operations Placing high voltage on the VPP pin enables read write operations Device operations are selected by writing specific data patterns into the command register Table 3 defines these 28F010 register commands Table 3 Command Definitions Command Read Memory Read Intelligent Identifier Codes(4) Set-up Erase Erase(5) Erase Verify(5) Set-up Program Program(6) Program Verify(6) Reset(7) Bus First Bus Cycle Second Bus Cycle Cycles Req'd Operation(1) Address(2) Data(3) Operation(1) Address(2) Data(3) 1 3 2 2 2 2 2 Write Write Write Write Write Write Write X IA X EA X X X 00H 90H 20H A0H 40H C0H FFH Read Write Read Write Read Write IA X X PA X X ID 20H EVD PD PVD FFH NOTES 1 Bus operations are defined in Table 2 2 IA e Identifier address 00H for manufacturer code 01H for device code EA e Erase Address Address of memory location to be read during erase verify PA e Program Address Address of memory location to be programmed Addresses are latched on the falling edge of the WE pulse 3 ID e Identifier Data Data read from location IA during device identification (Mfr e 89H Device e B4H) EVD e Erase Verify Data Data read from location EA during erase verify PD e Program Data Data to be programmed at location PA Data is latched on the rising edge of WE PVD e Program Verify Data Data read from location PA during program verify PA is latched on the Program command 4 Following the Read inteligent ID command two read operations access manufacturer and device codes 5 Figure 6 illustrates the Quick Erase Algorithm 6 Figure 5 illustrates the Quick Pulse Programming Algorithm 7 The second bus cycle must be followed by the desired command register write 8 28F010 of this high voltage memory contents are protected against erasure Refer to AC Erase Characteristics and Waveforms for specific timing parameters Erase-Verify Command The erase command erases all bytes of the array in parallel After each erase operation all bytes must be verified The erase verify operation is initiated by writing A0H into the command register The address for the byte to be verified must be supplied as it is latched on the falling edge of the WE pulse The register write terminates the erase operation with the rising edge of its WE pulse The 28F010 applies an internally-generated margin voltage to the addressed byte Reading FFH from the addressed byte indicates that all bits in the byte are erased The erase-verify command must be written to the command register prior to each byte verification to latch its address The process continues for each byte in the array until a byte does not return FFH data or the last address is accessed In the case where the data read is not FFH another erase operation is performed (Refer to Set-up Erase Erase) Verification then resumes from the address of the last-verified byte Once all bytes in the array have been verified the erase step is complete The device can be programmed At this point the verify operation is terminated by writing a valid command (e g Program Set-up) to the command register Figure 6 the Quick Erase algorithm illustrates how commands and bus operations are combined to perform electrical erasure of the 28F010 Refer to AC Erase Characteristics and Waveforms for specific timing parameters Set-up Program Program Commands Set-up Erase Erase Commands Set-up Erase is a command-only operation that stages the device for electrical erasure of all bytes in the array The set-up erase operation is performed by writing 20H to the command register To commence chip-erasure the erase command (20H) must again be written to the register The erase operation begins with the rising edge of the WE pulse and terminates with the rising edge of the next WE pulse (i e Erase-Verify Command) This two-step sequence of set-up followed by execution ensures that memory contents are not accidentally erased Also chip-erasure can only occur when high voltage is applied to the VPP pin In the absence Set-up program is a command-only operation that stages the device for byte programming Writing 40H into the command register performs the set-up operation Once the program set-up operation is performed the next WE pulse causes a transition to an active programming operation Addresses are internally latched on the falling edge of the WE pulse Data is internally latched on the rising edge of the WE pulse The rising edge of WE also begins the programming operation The programming operation terminates with the next rising edge of WE used to write the program-verify command Refer to AC Programming Characteristics and Waveforms for specific timing parameters Read Command While VPP is high for erasure and programming memory contents can be accessed via the read command The read operation is initiated by writing 00H into the command register Microprocessor read cycles retrieve array data The device remains enabled for reads until the command register contents are altered The default contents of the register upon VPP power-up is 00H This default value ensures that no spurious alteration of memory contents occurs during the VPP power transition Where the VPP supply is hard-wired to the 28F010 the device powers-up and remains enabled for reads until the command-register contents are changed Refer to the AC Read Characteristics and Waveforms for specific timing parameters Intelligent Identifier Command Flash memories are intended for use in applications where the local CPU alters memory contents As such manufacturer- and device-codes must be accessible while the device resides in the target system PROM programmers typically access signature codes by raising A9 to a high voltage However multiplexing high voltage onto address lines is not a desired system-design practice The 28F010 contains an Intelligent Identifier operation to supplement traditional PROM-programming methodology The operation is initiated by writing 90H into the command register Following the command write a read cycle from address 0000H retrieves the manufacturer code of 89H A read cycle from address 0001H returns the device code of B4H To terminate the operation it is necessary to write another valid command into the register 9 28F010 2 MV cm lower than EEPROM The lower electric field greatly reduces oxide stress and the probability of failure The 28F010 is capable or 100 000 program erase cycles The device is programmed and erased using Intel's Quick Pulse Programming and Quick Erase algorithms Intel's algorithmic approach uses a series of operations (pulses) along with byte verification to completely and reliably erase and program the device For further information see Reliability Report RR-60 QUICK PULSE PROGRAMMING ALGORITHM The Quick Pulse Programming algorithm uses programming operations of 10 ms duration Each operation is followed by a byte verification to determine when the addressed byte has been successfully programmed The algorithm allows for up to 25 programming operations per byte although most bytes verify on the first or second operation The entire sequence of programming and byte verification is performed with VPP at high voltage Figure 5 illustrates the Quick Pulse Programming algorithm QUICK ERASE ALGORITHM Intel's Quick Erase algorithm yields fast and reliable electrical erasure of memory contents The algorithm employs a closed-loop flow similar to the Quick Pulse Programming algorithm to simultaneously remove charge from all bits in the array Erasure begins with a read of memory contents The 28F010 is erased when shipped from the factory Reading FFH data from the device would immediately be followed by device programming For devices being erased and reprogrammed uniform and reliable erasure is ensured by first programming all bits in the device to their charged state (Data e 00H) This is accomplished using the Quick Pulse Programming algorithm in approximately two seconds Erase execution then continues with an initial erase operation Erase verification (data e FFH) begins at address 0000H and continues through the array to the last address or until data other than FFH is encountered With each erase operation an increasing number of bytes verify to the erased state Erase efficiency may be improved by storing the address of the last byte verified in a register Following the next erase operation verification starts at that stored address location Erasure typically occurs in one second Figure 6 illustrates the Quick Erase algorithm Program-Verify Command The 28F010 is programmed on a byte-by-byte basis Byte programming may occur sequentially or at random Following each programming operation the byte just programmed must be verified The program-verify operation is initiated by writing C0H into the command register The register write terminates the programming operation with the rising edge of its WE pulse The program-verify operation stages the device for verification of the byte last programmed No new address information is latched The 28F010 applies an internally-generated margin voltage to the byte A microprocessor read cycle outputs the data A successful comparison between the programmed byte and true data means that the byte is successfully programmed Programming then proceeds to the next desired byte location Figure 5 the 28F010 Quick Pulse Programming algorithm illustrates how commands are combined with bus operations to perform byte programming Refer to AC Programming Characteristics and Waveforms for specific timing parameters Reset Command A reset command is provided as a means to safely abort the erase- or program-command sequences Following either set-up command (erase or program) with two consecutive writes of FFH will safely abort the operation Memory contents will not be altered A valid command must then be written to place the device in the desired state EXTENDED ERASE PROGRAM CYCLING EEPROM cycling failures have always concerned users The high electrical field required by thin oxide EEPROMs for tunneling can literally tear apart the oxide at defect regions To combat this some suppliers have implemented redundancy schemes reducing cycling failures to insignificant levels However redundancy requires that cell size be doubled an expensive solution Intel has designed extended cycling capability into its ETOX flash memory technology Resulting improvements in cycling reliability come without increasing memory cell size or complexity First an advanced tunnel oxide increases the charge carrying ability ten-fold Second the oxide area per cell subjected to the tunneling electric field is one-tenth that of common EEPROMs minimizing the probability of oxide defects in the region Finally the peak electric field during erasure is approximately 10 28F010 Bus Command Operation Comments Standby Wait for VPP Ramp to VPPH(1) Initialize Pulse-Count Write Set-up Program Program Data e 40H Write Valid Address Data Standby Write Program(2) Verify Duration of Program Operation (tWHWH1) Data e C0H Stops Program Operation(3) tWHGL Read Byte to Verify Programming Standby Read Standby Compare Data Output to Data Expected Write Read Data e 00H Resets the Register for Read Operations Wait for VPP Ramp to VPPL(1) Standby 290207 - 5 NOTES 1 See DC Characteristics for the value of VPPH and VPPL 2 Program Verify is only performed after byte programming A final read compare may be performed (optional) after the register is written with the Read command 3 Refer to principles of operation 4 CAUTION The algorithm MUST BE FOLLOWED to ensure proper and reliable operation of the device Figure 5 28F010 Quick Pulse Programming Algorithm 11 28F010 Bus Command Operation Comments Entire Memory Must e 00H Before Erasure Use Quick Pulse Programming Algorithm (Figure 5) Standby Wait for VPP Ramp to VPPH(1) Initialize Addresses and Pulse-Count Write Write Set-up Erase Erase Data e 20H Data e 20H Standby Duration of Erase Operation (tWHWH2) Erase(2) Verify Addr e Byte to Verify Data e A0H Stops Erase Operation(3) tWHGL Read Byte to Verify Erasure Write Standby Read Standby Compare Output to FFH Increment Pulse-Count Write Read Data e 00H Resets the Register for Read Operations Wait for VPP Ramp to VPPL(1) Standby 290207 - 6 1 See DC Characteristics for the value of VPPH and VPPL 2 Erase Verify is performed only after chip-erasure A final read compare may be performed (optional) after the register is written with the read command 3 Refer to principles of operation 4 CAUTION The algorithm MUST BE FOLLOWED to ensure proper and reliable operation of the device Figure 6 28F010 Quick Erase Algorithm 12 28F010 DESIGN CONSIDERATIONS Two-Line Output Control Flash-memories are often used in larger memory arrays Intel provides two read-control inputs to accommodate multiple memory connections Two-line control provides for a the lowest possible memory power dissipation and b complete assurance that output bus contention will not occur To efficiently use these two control inputs an address-decoder output should drive chip-enable while the system's read signal controls all flashmemories and other parallel memories This assures that only enabled memory devices have active outputs while deselected devices maintain the low power standby condition circuit-board trace inductance and will supply charge to the smaller capacitors as needed VPP Trace on Printed Circuit Boards Programming flash-memories while they reside in the target system requires that the printed circuit board designer pay attention to the VPP power supply trace The VPP pin supplies the memory cell current for programming Use similar trace widths and layout considerations given the VCC power bus Adequate VPP supply traces and decoupling will decrease VPP voltage spikes and overshoots Power Up Down Protection The 28F010 is designed to offer protection against accidental erasure or programming during power transitions Upon power-up the 28F010 is indifferent as to which power supply VPP or VCC powers up first Power supply sequencing is not required Internal circuitry in the 28F010 ensures that the command register is reset to the read mode on power up A system designer must guard against active writes for VCC voltages above VLKO when VPP is active Since both WE and CE must be low for a command write driving either to VIH will inhibit writes The control register architecture provides an added level of protection since alteration of memory contents only occurs after successful completion of the two-step command sequences Power Supply Decoupling Flash-memory power-switching characteristics require careful device decoupling System designers are interested in three supply current (ICC) issues standby active and transient current peaks produced by falling and rising edges of chip-enable The capacitive and inductive loads on the device outputs determine the magnitudes of these peaks Two-line control and proper decoupling capacitor selection will suppress transient voltage peaks Each device should have a 0 1 mF ceramic capacitor connected between VCC and VSS and between VPP and VSS Place the high-frequency low-inherent-inductance capacitors as close as possible to the devices Also for every eight devices a 4 7 mF electrolytic capacitor should be placed at the array's power supply connection between VCC and VSS The bulk capacitor will overcome voltage slumps caused by printed- 28F010 Power Dissipation When designing portable systems designers must consider battery power consumption not only during device operation but also for data retention during system idle time Flash nonvolatility increases the usable battery life of your system because the 28F010 does not consume any power to retain code or data when the system is off Table 4 illustrates the power dissipated when updating the 28F010 Table 4 28F010 Typical Update Power Dissipation(4) Operation Array Program Program Verify Array Erase Erase Verify One Complete Cycle Notes 1 2 3 Power Dissipation (Watt-Seconds) 0 171 0 136 0 478 NOTES Bytes c typical Prog Pulses (tWHWH1 c IPP2 1 Formula to calculate typical Program Program Verify Power e VPP c typical a tWHGL c IPP4 typical) a VCC c Bytes c typical Prog Pulses (tWHWH1 c ICC2 typical a tWHGL c ICC4 typical 2 Formula to calculate typical Erase Erase Verify Power e VPP (VPP3 typical c tERASE typical a IPP5 typical c tWHGL c Bytes) a VCC (ICC3 typical c tERASE typical a ICC5 typical c tWHGL c Bytes) 3 One Complete Cycle e Array Preprogram a Array Erase a Program 4 ``Typicals'' are not guaranteed but based on a limited number of samples from production lots 13 28F010 ABSOLUTE MAXIMUM RATINGS Operating Temperature During Read During Erase Program Operating Temperature During Read During Erase Program Temperature Under Bias Temperature Under Bias Storage Temperature Voltage on Any Pin with Respect to Ground Voltage on Pin A9 with Respect to Ground VPP Supply Voltage with Respect to Ground During Erase Program VCC Supply Voltage with Respect to Ground Output Short Circuit Current OPERATING CONDITIONS Symbol TA TA VCC VCC Parameter NOTICE This is a production data sheet The specifications are subject to change without notice 0 C to a 70 C(1) 0 C to a 70 C(1) b 40 C to a 85 C(2) b 40 C to a 85 C(2) b 10 C to a 80 C(1) b 50 C to a 95 C(2) b 65 C to a 125 C b 2 0V to a 7 0V(3) b 2 0V to a 13 5V(3 4) WARNING Stressing the device beyond the ``Absolute Maximum Ratings'' may cause permanent damage These are stress ratings only Operation beyond the ``Operating Conditions'' is not recommended and extended exposure beyond the ``Operating Conditions'' may affect device reliability b 2 0V to a 14 0V(3 4) b 2 0V to a 7 0V(3) 100 mA(5) Limits Min Max 70 a 85 Unit C C V V Operating Temperature(1) Operating Temperature(2) VCC Supply Voltage (10%)(6) VCC Supply Voltage (5%)(7) 0 b 40 4 50 4 75 5 50 5 25 NOTES 1 Operating Temperature is for commercial product as defined by this specification 2 Operating Temperature is for extended temperature products as defined by this specification 3 Minimum DC input voltage is b 0 5V During transitions inputs may undershoot to b 2 0V for periods less than 20 ns Maximum DC voltage on output pins is VCC a 0 5V which may overshoot to VCC a 2 0V for periods less than 20 ns 4 Maximum DC voltage on A9 or VPP may overshoot to a 14 0V for periods less than 20 ns 5 Output shorted for no more than one second No more than one output shorted at a time 6 See High Speed AC Input Output reference Waveforms and High Speed AC Testing Load Circuits for testing characteristics 7 See AC Input Output reference Waveforms and AC Testing Load Circuits for testing characteristics DC CHARACTERISTICS Symbol ILI ILO ICCS ICC1 Parameter Input Leakage Current Output Leakage Current VCC Standby Current TTL NMOS COMPATIBLE Notes Min 1 1 1 1 03 10 Limits Typical(4) Max g1 0 g10 Commercial Products Unit mA mA mA mA Test Conditions VCC e VCC Max VIN e VCC or VSS VCC e VCC Max VOUT e VCC or VSS VCC e VCC Max CE e VIH VCC e VCC Max CE e VIL f e 6 MHz IOUT e 0 mA 10 30 VCC Active Read Current 14 28F010 DC CHARACTERISTICS (Continued) Symbol ICC2 ICC3 ICC4 ICC5 IPPS IPP1 IPP2 IPP3 IPP4 IPP5 VIL VIH VOL VOH1 VID IID VPPL VPPH VLKO Parameter TTL NMOS COMPATIBLE Notes 12 12 12 12 1 1 12 12 12 12 b0 5 Commercial Products Unit Test Conditions Limits Min Typical(4) Max 10 15 15 15 g10 VCC Programming Current VCC Erase Current VCC Program Verify Current VCC Erase Verify Current VPP Leakage Current VPPRead Current or Standby Current VPP Programming Current VPP Erase Current VPP Program Verify Current VPP Erase Verify Current Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage A9 Intelligent Identifer Voltage A9 Intelligent Identifier Current VPP during Read-Only Operations VPP during Read Write Operations VCC Erase Write Lock Voltage 10 50 50 50 mA Programming in Progress mA Erasure in Progress mA VPP e VPPH Program Verify in Progress mA VPP e VPPH Erase Verify in Progress mA VPP s VCC mA VPP l VCC VPP s VCC mA VPP e VPPH Programming in Progress mA VPP e VPPH Erasure in Progress mA VPP e VPPH Program Verify in Progress mA VPP e VPPH Erase Verify in Progress V V V V VCC e VCC Min IOL e 5 8 mA VCC e VCC Min IOH e b 2 5 mA 90 80 60 20 20 200 g10 0 30 30 50 50 08 VCC a 0 5 0 45 20 24 11 50 12 0 00 11 40 25 90 13 00 200 65 12 60 V mA A9 e VID V V V NOTE Erase Program are Inhibited when VPP e VPPL DC CHARACTERISTICS Symbol ILI ILO ICCS ICC1 Parameter Input Leakage Current CMOS COMPATIBLE Notes Min 1 1 1 1 50 10 Limits Typical(4) Commercial Products Unit Max g1 0 g10 Test Conditions VCC e VCC Max VIN e VCC or VSS VCC e VCC Max VOUT e VCC or VSS VCC e VCC Max CE e VCC g0 2V VCC e VCC Max CE e VIL f e 6 MHz IOUT e 0 mA 15 mA mA mA mA Output Leakage Current VCC Standby Current VCC Active Read Current 100 30 28F010 DC CHARACTERISTICS Symbol ICC2 ICC3 ICC4 ICC5 IPPS IPP1 Parameter VCC Programming Current VCC Erase Current VCC Program Verify Current VCC Erase Verify Current VPP Leakage Current VPP Read Current ID Current or Standby Current VPP Programming Current VPP Erase Current VPP Program Verify Current VPP Erase Verify Current Input Low Voltage Input High Voltage Output Low Voltage CMOS COMPATIBLE Notes Min 12 12 12 12 1 1 90 Limits Typical(4) 10 50 50 50 Commercial Products (Continued) Unit Max 10 15 15 15 mA mA mA mA mA mA Programming in Progress Erasure in Progress VPP e VPPH Program Verify in Progress VPP e VPPH Erase Verify in Progress VPP s VCC VPP l VCC VPP s VCC mA mA mA mA V V V VCC e VCC Min IOL e 5 8 mA VCC e VCC Min IOH e b2 5 mA VCC e VCC Min IOH e b100 mA 13 00 V mA A9 e VID NOTE Erase Programs are Inhibited when VPP e VPPL VPP e VPPH Programming in Progress VPP e VPPH Erasure in Progress VPP e VPPH Program Verify in Progress VPP e VPPH Erase Verify in Progress Test Conditions g10 200 g10 IPP2 IPP3 IPP4 IPP5 VIL VIH VOL VOH1 VOH2 VID IID VPPL VPPH VLKO 12 12 12 12 b0 5 80 60 20 20 30 30 50 50 08 VCC a 0 5 0 45 0 7 VCC Output High Voltage A9 Intelligent Identifier Voltage A9 Intelligent Identifier Current VPP during Read-Only Operations VPP during Read Write Operations VCC Erase Write Lock Voltage 12 0 85 VCC VCC b 0 4 11 50 90 0 00 11 40 25 V 200 65 12 60 V V V 16 28F010 DC CHARACTERISTICS Products Symbol ILI ILO ICCS ICC1 ICC2 ICC3 ICC4 ICC5 IPPS IPP1 IPP2 IPP3 IPP4 IPP5 VIL VIH VOL VOH1 VID IID VPPL VPPH VLKO Parameter Input Leakage Current Output Leakage Current VCC Standby Current VCC Active Read Current TTL NMOS COMPATIBLE Notes 1 1 1 1 12 12 12 12 1 1 12 12 12 12 b0 5 Extended Temperature Unit Test Conditions Limits Min Typical(4) Max g1 0 g10 mA VCC e VCC Max VIN e VCC or VSS mA VCC e VCC Max VOUT e VCC or VSS mA VCC e VCC Max CE e VIH mA VCC e VCC Max CE e VIL f e 6 MHz IOUT e 0 mA mA Programming in Progress mA Erasure in Progress mA VPP e VPPH Program Verify in Progress mA VPP e VPPH Erase Verify in Progress mA VPP s VCC mA VPP l VCC VPP s VCC mA VPP e VPPH Programming in Progress mA VPP e VPPH Erasure in Progress mA VPP e VPPH Program Verify in Progress mA VPP e VPPH Erase Verify in Progress 03 10 10 50 50 50 10 30 30 30 30 30 g10 VCC Programming Current VCC Erase Current VCC Program Verify Current VCC Erase Verify Current VPP Leakage Current VPP Read Current or Standby Current VPP Programming Current VPP Erase Current VPP Program Verify Current VPP Erase Verify Current Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage A9 Intelligent Identifer Voltage A9 Intelligent Identifier Current VPP during Read-Only Operations VPP during Read Write Operations VCC Erase Write Lock Voltage 90 80 60 20 20 200 g10 0 30 30 50 50 20 08 V VCC a 0 5 V 0 45 V VCC e VCC Min IOL e 5 8 mA V VCC e VCC Min IOH e b 2 5 mA 13 00 90 500 65 12 60 V mA A9 e VID V NOTE Erase Program are Inhibited when VPP e VPPL V V 24 11 50 12 0 00 11 40 25 17 28F010 DC CHARACTERISTICS Products Symbol ILI ILO ICCS ICC1 ICC2 ICC3 ICC4 ICC5 IPPS IPP1 Parameter Input Leakage Current Output Leakage Current VCC Standby Current VCC Active Read Current VCC Programming Current VCC Erase Current VCC Program Verify Current VCC Erase Verify Current VPP Leakage Current VPP Read Current ID Current or Standby Current VPP Programming Current VPP Erase Current VPP Program Verify Current VPP Erase Verify Current Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage CMOS COMPATIBLE Notes Min 1 1 1 1 12 12 12 12 1 1 90 50 10 10 50 50 50 Limits Typical(4) Extended Temperature Unit Max g1 0 g10 Test Conditions mA VCC e VCC Max VIN e VCC or VSS mA VCC e VCC Max VOUT e VCC or VSS mA VCC e VCC Max CE e VCC g0 2V mA VCC e VCC Max CE e VIL f e 10 MHz IOUT e 0 mA mA Programming in Progress mA Erasure in Progress mA VPP e VPPH Program Verify in Progress mA VPP e VPPH Erase Verify in Progress mA VPP s VCC mA VPP l VCC VPP s VCC mA VPP e VPPH Programming in Progress mA VPP e VPPH Erasure in Progress mA VPP e VPPH Program Verify in Progress mA VPP e VPPH Erase Verify in Progress V V V VCC e VCC Min IOL e 5 8 mA VCC e VCC Min IOH e b 2 5 mA VCC e VCC Min IOH e b 100 mA 100 30 10 30 30 30 g10 200 g10 IPP2 IPP3 IPP4 IPP5 VIL VIH VOL VOH1 VOH2 VID IID 12 12 12 12 b0 5 80 60 20 20 30 30 50 50 08 VCC a 0 5 0 45 0 7 VCC 0 85 VCC VCC b 0 4 V A9 Intelligent Identifer Voltage A9 Intelligent Identifier Current 12 11 50 90 13 00 500 V mA A9 e VID 18 28F010 DC CHARACTERISTICS Products (Continued) Symbol VPPL VPPH VLKO Parameter VPP during Read-Only Operations VPP during Read Write Operations VCC Erase Write Lock Voltage CMOS COMPATIBLE Notes Min 0 00 11 40 25 Limits Typical(4) Extended Temperature Unit Max 65 12 60 V V V NOTE Erase Programs are Inhibited when VPP e VPPL Test Conditions CAPACITANCE TA e 25 C f e 1 0 MHz Symbol CIN COUT Parameter Address Control Capacitance Output Capacitance Notes 3 3 Limits Min Max 8 12 pF pF VIN e 0V VOUT e 0V Unit Conditions NOTES 1 All currents are in RMS unless otherwise noted Typical values at VCC e 5 0V VPP e 12 0V T e 25 C These currents are valid for all product versions (packages and speeds) 2 Not 100% tested characterization data available 3 Sampled not 100% tested 4 ``Typicals'' are not guaranteed but based on a limited number of samples from production lots 19 28F010 AC TESTING INPUT OUTPUT WAVEFORM(1) HIGH SPEED AC TESTING INPUT OUTPUT WAVEFORM(2) 290207 - 7 290207 - 8 AC test inputs are driven at VOH (2 4 VTTL) for a Logic ``1'' and VOL (0 45 VTTL) for a Logic ``0'' Input timing begins at VIH (2 0 VTTL) and VIL (0 8 VTTL) Output timing ends at VIH and VIL Input rise and fall times (10% to 90%) k10 ns AC test inputs are driven at 3 0V for a Logic ``1'' and 0 0V for a Logic ``0'' Input timing begins and output timing ends at 1 5V Input rise and fall times (10% to 90%) k10 ns AC TESTING LOAD CIRCUIT(1) HIGH SPEED AC TESTING LOAD CIRCUIT(2) CL e 100 pF CL includes Jig Capacitance RL e 3 3 KX 290207 -22 CL e 30 pF CL includes Jig Capacitance RL e 3 3 KX 290207 - 23 AC TEST CONDITIONS(1) Input Rise and Fall Times (10% to 90%) 10 ns Input Pulse Levels 0 45V and 2 4V Input Timing Reference Level Output Timing Reference Level Capacitive Load 0 8V and 2 0V 0 8V and 2 0V 100 pF HIGH-SPEED AC TEST CONDITIONS(2) Input Rise and Fall Times (10% to 90%) 10 ns Input Pulse Levels 0 0V and 3 0V Input Timing Reference Level Output Timing Reference Level Capacitive Load 1 5V 1 5V 30 pF NOTES 1 Testing characteristics for 28F010-65 in standard configuration and 28F010-90 28F010-120 and 28F010-150 2 Testing characteristics for 28F010-65 in high speed configuration 20 Versions VCC g 10% Characteristic Read Cycle Time CE Address Access Time OE CE Chip Disable to Output in High Z OE to Output in Low Z Output Disable to Output in High Z Output Hold from Address CE or OE Change Write Recovery Time before Read 6 6 6 12 0 0 0 0 6 2 30 30 30 30 0 6 23 0 0 0 0 2 35 40 45 55 0 35 to Low Z 23 0 0 0 0 0 55 Access Time 25 28 35 50 55 65 70 90 120 150 Access Time 65 70 90 120 150 65 70 90 120 150 ns ns ns ns ns ns ns ns ns ms Notes Min Max Min Max Min Max Min Max Min Max 28F010-65(5) Unit 28F010-90(5) 28F010-120(5) 28F010-150(5) VCC g 5% 28F010-65(4) Symbol tAVAV tRC tELQV tCE tAVQV tACC tGLQV tOE tELQX tLZ AC CHARACTERISTICS Temperature Products tEHQZ tGLQX tOLZ tGHQZ tDF tOH Read Only Operations tWHGL NOTES 1 Whichever occurs first 2 Sampled not 100% tested 3 Guaranteed by design 4 See High Speed AC Input Output reference Waveforms and High Speed AC Testing Load Circuits for testing characteristics 5 See AC Input Output reference Waveforms and AC Testing Load Circuits for testing characteristics Commercial and Extended 28F010 21 28F010 Figure 7 AC Waveforms for Read Operations 22 290207- 9 Versions VCC g 10% Characteristic Write Cycle Time Address Set-Up Time Address Hold Time 6 Data Set-Up Time 6 Data Hold Time Write Recovery Time before Read Read Recovery Time before Write Chip Enable Set-Up Time before Write Chip Enable Hold Time Write Pulse Width 6 Write Pulse Width High Duration of Programming Operation Duration of Erase Operation VPP Set-Up Time to Chip Enable Low 2 1 1 3 95 95 3 10 10 20 20 20 10 95 1 55 20 10 95 1 20 10 95 1 ns ms ms ms 40 40 40 0 0 0 15 15 15 15 0 60 2 0 0 0 0 6 6 6 6 10 10 10 10 55 10 6 0 15 0 60 ns ms ns ns ns ns 40 40 40 40 40 55 ns 40 40 40 40 40 0 0 0 0 0 65 70 90 120 150 ns ns ns Notes Min Max Min Max Min Max Min Max Min Max 28F010-65(5) Unit 28F010-90(5) 28F010-120(5) 28F010-150(5) VCC g 5% 28F010-65(4) Symbol tAVAV tWC tAVWL tAS tWLAX tAH tDVWH tDS tWHDX tDH tWHGL tGHWL tELWL tCS tWHEH tCH tWLWH tWP tWHWL tWPH tWHWH1 tWHWH2 AC CHARACTERISTICS Write Erase Program Only Operations(1) Commercial and Extended Temperature Products tVPEL NOTES 1 Read timing characteristics during read write operations are the same as during read-only operations Refer to AC Characteristics for Read-Only Operations 2 Guaranteed by design 3 The integrated stop timer terminates the programming erase operations thus eliminating the need for a maximum specification 4 See High Speed AC Input Output reference Waveforms and High Speed AC Testing Load Circuits for testing characteristics 5 See AC Input Output reference Waveforms and AC Testing Load Circuits for testing characteristics 6 Minimum specification for Extended Temperature product 28F010 23 28F010 290207 - 13 290207 - 15 Figure 8 Typical Programming Capability Figure 10 Typical Erase Capability 290207 - 14 290207 - 16 Figure 9 Typical Program Time at 12V Figure 11 Typical Erase Time at 12V 24 28F010 Figure 12 AC Waveforms for Programming Operations 25 290207- 10 28F010 Figure 13 AC Waveforms for Erase Operations 26 290207- 11 Versions VCC g 10% Characteristic Write Cycle Time Address Set-Up Time Address Hold Time 6 Data Set-Up Time 6 Data Hold Time Write Recovery Time before Read Read Recovery Time before Write Write Enable Set-Up Time before Chip Enable Write Enable Hold Time Write Pulse Width 6 Write Pulse Width High Duration of Programming Operation Duration of Erase Operation VPP Set-Up Time to Chip Enable Low 2 1 1 3 95 95 3 10 10 10 95 1 20 20 20 60 20 10 95 1 20 10 95 1 ns ms ms ms 45 45 45 0 0 0 0 70 0 0 0 0 2 0 0 0 0 6 6 6 6 10 10 10 10 6 0 0 0 70 50 10 ns ms ns ns ns ns 35 35 35 45 45 60 ns 45 45 45 55 55 0 0 0 0 0 ns ns 65 70 90 120 150 ns Notes Min Max Min Max Min Max Min Max Min Max 28F010-65(5) Unit 28F010-90(5) 28F010-120(5) 28F010-150(5) VCC g 5% 28F010-65(2 4) Symbol tAVAV tAVEL tELAX AC CHARACTERISTICS Extended Temperature tDVEH tEHDX tEHGL tGHWL tWLEL tEHWH tELEH tEHEL tEHEH1 tEHEH2 Alternative CE -Controlled Writes tVPEL Commercial and NOTE 1 Read timing characteristics during read write operations are the same as during read-only operations Refer to AC Characteristics for Read-Only Operations 2 Guaranteed by design 3 The integrated stop timer terminates the programming erase operations thus eliminating the need for a maximum specification 4 See High Speed AC Input Output reference Waveforms and High Speed AC Testing Load Circuits for testing characteristics 5 See AC Input Output reference Waveforms and AC Testing Load Circuits for testing characteristics 6 Minimum specification for Extended Temperature product 28F010 27 28F010 ERASE AND PROGRAMMING PERFORMANCE Parameter Notes Min Chip Erase Time 134 Chip Program Time 124 Typical 1 2 Max 10 12 5 Unit Sec Sec NOTES 1 ``Typicals'' are not guaranteed but based on samples from production lots Data taken at 25 C 12 0V VPP 2 Minimum byte programming time excluding system overhead is 16 msec (10 msec program a 6 msec write recovery) while maximum is 400 msec byte (16 msec x 25 loops allowed by algorithm) Max chip programming time is specified lower than the worst case allowed by the programming algorithm since most bytes program significantly faster than the worst case byte 3 Excludes 00H programming prior to erasure 4 Excludes system level overhead 28 28F010 NOTE Alternative CE -Controlled Write Timings also apply to erase operations Figure 14 Alternate AC Waveforms for Programming Operations 29 290207- 19 28F010 ORDERING INFORMATION 290207 - 20 VALID COMBINATIONS P28F010-65 N28F010-65 P28F010-90 N28F010-90 P28F010-120 N28F010-120 P28F010-150 N28F010-150 E28F010-65 E28F010-90 E28F010-120 E28F010-150 F28F010-65 F28F010-90 F28F010-120 F28F010-150 TN28F010-90 TE28F010-90 TF28F010-90 ADDITIONAL INFORMATION ER-20 ER-24 ER-28 RR-60 AP-316 AP-325 ``ETOX Flash Memory Technology'' ``Intel Flash Memory'' ``ETOX III Flash Memory Technology'' ``ETOX Flash Memory Reliability Data Summary'' ``Using Flash Memory for In-System Reprogrammable Nonvolatile Storage'' ``Guide to Flash Memory Reprogramming'' Order Number 294005 294008 294012 293002 292046 292059 REVISION HISTORY Number 007 Description Removed 200 ns Speed Bin Revised Erase Maximum Pulse Count for Figure 5 from 3000 to 1000 Clarified AC and DC Test Conditions Added ``dimple'' to F TSOP Package Corrected Serpentine Layout Corrected AC Waveforms Added Extended Temperature Options Added 28F010-65 and 28F010-90 speeds Revised Symbols i e CE OE etc to CE OE etc 008 009 010 Completion of Read Operation Table Labelling of Program Time in Erase Program Table Textual Changes or Edits Corrected Erase Program Times 30 |
Price & Availability of F28F010-120
 |
|
|
|
|
All Rights Reserved © IC-ON-LINE 2003 - 2022 |
| [Add Bookmark] [Contact Us] [Link exchange] [Privacy policy] |
|
Mirror Sites : [www.datasheet.hk]
[www.maxim4u.com] [www.ic-on-line.cn]
[www.ic-on-line.com] [www.ic-on-line.net]
[www.alldatasheet.com.cn]
[www.gdcy.com]
[www.gdcy.net] |